Showing results: 241 - 255 of 803 items found.
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i-iX Series II -
AMETEK Programmable Power, Inc.
The iX Series II represents a new generation of AC and DC power source that addresses increasing demands on test equipment to perform more functions at a lower cost. By combining a flexible AC/DC power source with a high performance power analyzer, the iX Series II systems are capable of handling complex applications that have traditionally required multiple instruments.
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Mercury Systems, Inc.
High-power, rackmount amplifiers utilize advanced power combining techniques to achieve high output power levels. These integrated amplifiers include advanced cooling capabilities and other customizable features. Though a focus on modularity, these rackmount amplifiers are ready for easy integration into a larger system or lab test bench.
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N6900 Series -
Keysight Technologies
The Advanced Power System (APS) N6900 Series power supply is ideal for automated test equipment (ATE) applications where high performance is critical. Adding any combination of the four performance options will increase performance where you want it most. Versatility has never been faster.
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ELMA Electronic, Inc.
Embedded Computing Systems require more than just a chassis housing with backplane, power supply, cooling and payload boards. To compliment our wide range of systems, Elma offers a comprehensive range of system level accessories, including: I/O solutions, HMI displays, system/power management controllers and test & development boards.
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XD90 -
Hangzhou Xihu Electronic Institute
The XD90 integrated modular power system testing vehicle provides an integrated yet flexible solution of preforming a wide selection of normal and specialty tests on power equipment. Designed with the effectiveness and efficiency of power testing in mind, this platform achieves the goal of “integration of functions” instead of just a “combination of instruments”. Not only it provides an abundant means of power testing, but with optimized device placement, operational convenience, and safety factor.
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LPDDR4 and LPDDR3 -
Triad Spectrum, Inc.
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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CIS Series -
Com-Power Corporation
The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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M9380A -
Keysight Technologies
Save floor space with a compact, modular analog signal generator Provides Keysight quality and performance for local oscillator (LO) substitution, interference and component test Minimize need for external amplification with output power of +18 dBm across the frequency range Reduce test time with easy integration into your high-speed automated test system
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Keithley PCT -
Tektronix, Inc.
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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6U VME 6021 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6021 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards.Designed primarily for applications in data acquisition, control and test instrumentation, it combines superior mechanical quality with lowest noise power supply technology.
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6U VME 6023 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards.Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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9U VME64x 6021 -
W-IE-NE-R, Plein & Baus GmbH
WIENER VME 6021 crate series is the newest generation of 19" integrated packaging system for VME/VME64x bus systems with 9Ux400mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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DAQ -
Mars Labs LLC
Titan Data Acquisition (DAQ) Systems offer universal signal conditioning, low power consumption, convenient SD card storage, and easy-to-use software. Systems can be purchased as a complete test kit, including custom cables and accessories. Titan products are designed and built in the US.
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9U VME64x 6023 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for VME/VME64 bus systems with 9Ux400mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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Shenzhen UYIGAO Electronic Technology Co., Ltd
UYIGAO DC electronic loads provide you with the flexibility to test a wide range of power sources. Perform both static and dynamic tests to ensure that your devices can handle the steady state and occasional transient loads. The 16-bit voltage, current, and power-measurement systems provide accuracy analysis.